X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 0.2 M ammonium acetate, 0.1 M sodium acetate, 30% polyethylene glycol (PEG) 4000, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 28.116 Å b: 49.521 Å c: 100.554 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.78
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.150 10.000 50689 2572 99.860 0.156 0.177 10.850
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.150 10.000 99.900 0.051 0.051 27.4 5.800 50803 50773 2.0 2.0 9.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.15 1.17 99.80 ? 0.238 6.6 4.30 2516
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-C 0.9002 APS 14-BM-C
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SOLVE phasing 2.10
RESOLVE phasing 2.10
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
HKL-2000 data collection .
HKL-2000 data reduction .
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