X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.50 293 trimethylamine N-oxide dihydrate, Polyethylene Glycol, Monomethyl ether 2000, pH 8.50, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 48.350 Å b: 67.710 Å c: 79.980 Å α: 90.00° β: 98.90° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.50 33.36 81248 14995 96.0 0.2 0.226 15.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.50 50 99.90 0.066 0.066 28.70 6.20 160587 154166 1 2 11.20
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.50 1.55 99.40 ? 0.286 4 5.60 8038
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BSRF BEAMLINE 3W1A 0.9500, 0.9794, 0.9799 BSRF 3W1A
Software
Software Name Purpose Version
CNS refinement 1.1
MAR345 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .