X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 50 mM MES at pH 6.0 25 mM Tris-HCl pH 7-8 100 mM NaCo or NaNO3 23-27% PEG 3350 very sensitive to temperatue stabilized by slow addition to of PEG 20,000 to 2-3%, VAPOR DIFFUSION, temperature 295K
Unit Cell:
a: 87.46 Å b: 87.46 Å c: 59.10 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.86
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR ? 2.5 32 6684 562 86.5 0.176 0.284 38.885
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 32 86.5 ? 0.035 13.97 3.7 7727 6684 1.0 3.0 51.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.5 2.64 61.4 ? ? 5.5 2.2 683
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 295 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RU200 ? ? ?
Software
Software Name Purpose Version
CNS refinement .
PDB_EXTRACT data extraction 2.000
CrystalClear data collection (MSC/RIGAKU)
DENZO data reduction .
CCP4 data scaling (ROTAVATA)
CCP4 phasing .