X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 288 0.05M phosphate buffer, 0.1M citric acid, 1.6M ammonium sulfate, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 288K
Unit Cell:
a: 62.064 Å b: 62.064 Å c: 238.436 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.900 9.500 20863 1059 93.280 0.196 0.24 15.189
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.620 49.000 70.400 0.125 ? 8.100 4.740 25261 25261 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.62 1.68 7.20 ? ? 1.2 1.24 254
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 1.03320 NSLS X6A
Software
Software Name Purpose Version
d*TREK data scaling 9.1L
AMoRE phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 2.000
MAR345 data collection 345DTB
d*TREK data reduction .