X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.40 294 6% PEG 3350, 0.05M Tris-HCl, 0.005M MgCl2, 0.025M CaCl2, 0.002M ANP, pH 7.40, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 84.200 Å b: 84.200 Å c: 104.700 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61
Crystal Properties:
Matthew's Coefficient: 3.04 Solvent Content: 59.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9 20.00 31855 1593 99.9 0.191 0.211 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 40.000 99.7 0.062 0.062 42.4 22.2 31896 31855 0.000 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 2.09 99.4 ? 0.42 8.7 22.0 5933
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 1.3303 CLSI 08ID-1
Software
Software Name Purpose Version
AMoRE phasing .
CNS refinement 1.0
MAR345 data collection 345DTB
XDS data reduction .
XDS data scaling .
CNS phasing .