ELECTRON MICROSCOPY

Sample

KIF1A head decorated-microtubule complex

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument ?
Cryogen Name ?
Sample Vitrification Details Ethan slash
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles ?
Reported Resolution (Å) 10
Resolution Method ?
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target Best cross-correlation
Overall B Value ?
Fitting Procedure ?
Details REFINEMENT PROTOCOL--rigid body REFINEMENT
Data Acquisition
Detector Type KODAK SO-163 FILM
Electron Dose (electrons/Å2) 10
Imaging Experiment
Date of Experiment 1999-01-01
Temprature (Kelvin)
Microscope Model JEOL 2010F
Minimum Defocus (nm) 11000
Maximum Defocus (nm) 33000
Minimum Tilt Angle (degrees) 0
Maximum Tilt Angle (degrees) 0
Nominal CS 3.3
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 40000
Calibrated Magnification 40000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
CTF CORRECTION CTFFIND 3
MODEL FITTING SITUS COLORES ?
RECONSTRUCTION Ruby-Helix ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
. each filament
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