ISDA

2HV7

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.8	293	0.2 mM Na Formate, 5% glycerol, 16% PEG3350 (w/v), 50 mM Glycine, 0.1 M BisTris, pH 6.8, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 80.041 Å b: 86.096 Å c: 95.099 Å α: 73.91° β: 89.97° γ: 73.31°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.04 Solvent Content: 39.67

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.50	50.00	67017	3608	87.70	0.25183	0.31246	11.367

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.5	100	94.6	?	0.083	?	1.8	80608	76255	0	0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.5	2.6	91.1	?	0.377	?	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X29A	1.1	NSLS	X29A

Software