X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION
X-RAY DIFFRACTION
Unit Cell:
a: 100.110 Å b: 100.110 Å c: 66.916 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 3.00 Solvent Content: 58.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.740 29.424 20422 1072 97.430 0.175 0.207 28.343
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.740 29.424 98.700 0.076 0.076 6.400 11.500 ? 20444 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.74 1.79 96.80 ? 0.852 0.9 7.10 1376
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 1.000001 SSRL BL11-1
Software
Software Name Purpose Version
MolProbity model building 3beta29
SHELX phasing .
REFMAC refinement 5.2.0005
SCALA data scaling .
PDB_EXTRACT data extraction 2.000
MOSFLM data reduction .
CCP4 data scaling (SCALA)
SHELXD phasing .
autoSHARP phasing .