X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 289 0.095 mM Sodium-citrate pH 5.6, 19% isopropanol (v/v), 19% PEG 4K (w/v), 5% glycerol (v/v), VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 137.099 Å b: 69.047 Å c: 70.126 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 2.87 Solvent Content: 57.13
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.000 31.3 41179 2070 89.900 0.242 0.248 47.626
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 31.3 99.800 0.061 ? 10.700 7.040 ? 45900 0.0 0.0 27.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 100.00 ? ? 2.0 6.64 4524
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X12C 0.980301, 0.95 NSLS X12C
Software
Software Name Purpose Version
d*TREK data scaling 9.5L
SnB phasing .
CNS refinement .
PDB_EXTRACT data extraction 2.000
d*TREK data reduction .