X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 ? 15-20% PEG 4K,.1M NAACETATE PH4.6 45 MG/ML PROTEIN CONCENTRATION PRE-COMPLEXED WITH CELLOBIOSE-DNP
Unit Cell:
a: 88.411 Å b: 88.411 Å c: 80.675 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 46.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR SUBSTITUTION THROUGHOUT 1.84 15.0 27679 2255 96.1 0.22 0.28 21.14
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.74 ? 96.10 ? 0.0681 16.19 4.7 ? 32211 ? 2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.74 1.81 80.40 0.3611 2.01 4.41
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH2R ? ? ?
Software
Software Name Purpose Version
SDMW data collection HOWARD & NEILSON
X-PLOR model building 3.851
X-PLOR refinement 3.851
SDMS data reduction DETECTOR SYSTEM (NIELSEN)
XENGEN data reduction (HOWARD
NIELSEN data reduction .
XUONG) data reduction .
X-PLOR phasing 3.851