X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 15% PEG 4000, 0.1M ammonium sulfate, 150mM NaCl, 1.25%PEG-MME 550, 1% 2-propanol, 0.5mM zinc sulfate, 5mM MES , pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 32.326 Å b: 34.107 Å c: 34.802 Å α: 78.21° β: 69.85° γ: 64.79°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.83 Solvent Content: 32.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.59 21.66 15825 1593 93.4 ? 0.2209 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.59 21.66 93.4 ? ? ? ? 15825 15825 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.59 1.66 91.0 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.98793, 0.97938, 0.97908, 0.96866 NSLS X4A
Software
Software Name Purpose Version
ADSC data collection .
DENZO data reduction .
SnB phasing .
CNS refinement 1.1
SCALEPACK data scaling .