X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 291 100mM sodium acetate (pH 5), 18% PEG3350, 100mM sodium fluoride, 50mM lithium sulfate, and 5mM DTT., VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 71.086 Å b: 55.335 Å c: 97.166 Å α: 90.00° β: 90.26° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.38 Solvent Content: 48.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.80 22.79 122837 12071 89.5 0.181 0.208 22.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.80 22.79 99.2 0.061 0.047 24.8 4.4 137636 136535 0 0 13.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 99.8 ? 0.303 4.04 4.3 13737
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97925 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection .
DENZO data reduction .
SCALEPACK data scaling .
SnB phasing .
SOLVE phasing .
RESOLVE phasing .
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