X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 298.0 0.1M Tris-HCl, 10mM nickel chloride, 14% PEG MME2000, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
Unit Cell:
a: 37.002 Å b: 37.002 Å c: 80.949 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4 21 2
Crystal Properties:
Matthew's Coefficient: 2.05 Solvent Content: 39.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.75 80.85 5557 600 99.08 0.24303 0.28702 38.101
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 80.85 99.1 0.05 0.05 17.0 7.9 6157 6157 0.0 0.0 27.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.81 98.3 ? 0.404 4.4 7.2 578
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.9793, 0.9796, 0.9681 NSLS X4A
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
ADSC data collection .
DENZO data reduction .
SCALEPACK data scaling .
SOLVE phasing .
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