X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4 298 100mM Na3Citrate, 10% PEG 20k, 100 mM NH4Cl, 5 mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 117.065 Å b: 54.609 Å c: 96.354 Å α: 90.00° β: 118.23° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.19 Solvent Content: 43.80
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.30 28.30 23140 1143 96.1 0.236 0.294 42.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50.0 0.97 0.092 0.086 30.7 7.1 28498 27643 0 0 26.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.37 ? ? 0.086 22.4 6.4 2387
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.9793, 0.97952, 0.96800 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection .
HKL-2000 data scaling .
SOLVE phasing .
Feedback Form
Name
Email
Institute
Feedback