X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7 293 100mM HEPES, 100mM Mg(NO3)2, 20% PEG8K, 5 mM DTT, Microbatch under oil, pH 7, temperature 293K
Unit Cell:
a: 61.304 Å b: 108.751 Å c: 80.495 Å α: 90.00° β: 108.59° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.61 Solvent Content: 52.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.60 29.45 53201 5313 87.8 0.23 0.292 40.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 29.45 99.9 0.11 0.081 13.31 4.3 60679 60619 0 0 22.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.69 99.9 ? 0.509 3.0 4.3 6068
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97916 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection .
DENZO data reduction .
SCALEPACK data scaling .
SnB phasing .
SOLVE phasing .
RESOLVE phasing .
XTALVIEW refinement .
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