X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 294 100MM HEPES, pH 7.0, 25% PEG MME550, 50MM MGCL2, 10% GLYCEROL, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 116.972 Å b: 116.972 Å c: 116.095 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 45.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.60 20.00 99412 3096 99.98 0.186 0.218 11.534
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.52 50.000 99.6 0.083 0.074 5.9000 7.400 119062 119062 0 0 8.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.52 1.60 99.6 ? 0.135 5.400 6.30 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.9794 APS 31-ID
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
TRUNCATE data reduction .
MOLREP phasing .
REFMAC refinement 5.2.0005
CCP4 data scaling (SCALA
TRUNCATE data scaling .
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