X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.3 295 0.2 M Calcium Chloride dihydrate, 0.25 Sodium Chloride, 0.01 M TRIS-HCL, 20%w/v PEG3350, pH 8.3, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 134.137 Å b: 76.995 Å c: 85.112 Å α: 90.00° β: 109.25° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 2.39 27.9 28845 1520 93.46 0.17194 0.24883 29.096
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.39 30.0 94.0 0.071 ? 16.3 3.4 30366 30366 ? -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.39 2.49 93.8 ? ? 9.7 3.0 3023
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 1.00882 APS 19-ID
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
ADSC data collection .
HKL-2000 data scaling .
PHENIX phasing .
SHARP phasing .