X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 277 100 mM Sodium Citrate, 5.76M Potassium Acetate, and 5 mM DTT. , pH 4.0, Microbatch., temperature 277K
Unit Cell:
a: 90.889 Å b: 90.889 Å c: 122.319 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32
Crystal Properties:
Matthew's Coefficient: 4.15 Solvent Content: 70.38
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.50 29.75 34490 3468 88.2 0.195 0.227 39.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 29.75 99.5 0.11 0.088 12.29 3.8 39116 38921 0 0 31.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.59 100 ? 0.534 2.9 3.7 3921
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.9795 NSLS X4C
Software
Software Name Purpose Version
CNS refinement 1.1
ADSC data collection .
HKL-2000 data scaling .
SnB phasing .
SOLVE phasing .
RESOLVE phasing .
XTALVIEW refinement .
Feedback Form
Name
Email
Institute
Feedback