X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 295 20% PEG 6K, 100 mM MES, 0.17 M ammonium sulfate 100 microliter reservoir, 800 nanoliter drop,intelliplate, pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 56.174 Å b: 56.174 Å c: 119.397 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 1.89 Solvent Content: 34.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.75 20.00 18868 1016 99.37 0.20022 0.25829 30.581
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 50 99.3 ? 0.077 11.4 8.5 20024 20024 0 0 29.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.81 98.9 ? 0.68 1.9 6.4 1949
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 70.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 0.97910, 0.97951, 0.97444 ALS 5.0.2
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
Blu-Ice data collection .
HKL-2000 data scaling .
SOLVE phasing .