ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	9.5	293	The reservoir contained 30% PEG 400, 0.1M 2(cyclohexylamino)ethanosulfonic acid. The crystal was then move to a reservoir containing 30% PEG 400, 0.1M 2(cyclohexylamino)ethanosulfonic acid, and 0.2M Na2SO4., pH 9.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 66.196 Å b: 66.196 Å c: 27.421 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 6

Crystal Properties:

Matthew's Coefficient: 1.73 Solvent Content: 29.24

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	FOURIER SYNTHESIS	THROUGHOUT	1.610	57.350	9066	432	99.030	0.22	0.26	15.949

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.600	90.000	99.800	0.104	?	12.700	14.400	9134	9134	0	0	27.7

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.60	1.66	98.5	98.50	?	?	12.10	891

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ALS BEAMLINE 8.2.2	1.00000	ALS	8.2.2

Software