X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 293.0 2.0M ammonium sulfate, 0.1M HEPES buffer (pH=8.0),2%(w/v) PEG 4K, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
Unit Cell:
a: 35.416 Å b: 47.783 Å c: 85.432 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 1.908668 Solvent Content: 35.557152
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS THROUGHOUT 2.20 42.72 7281 782 93.3 0.186 0.238 29.0
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50.0 99.8 0.104 ? ? ? 7948 7932 ? 0.0 13.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 98.4 ? ? ? ? 762
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 293.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE CONVENTIONAL Cu 1.5418 ? ?
Software
Software Name Purpose Version
CNS refinement 1.0
SMART data reduction .
HKL-2000 data scaling .
CNS phasing .
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