X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.0 289 4.06 M NaCl, 50 mM glycine, pH 10.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 182.832 Å b: 182.832 Å c: 287.429 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 41 2 2
Crystal Properties:
Matthew's Coefficient: 3.6 Solvent Content: 65.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 3.000 29.750 48826 2458 100.000 ? 0.292 40.457
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.0 129.1 99.97 0.081 ? 7.8737 16.4 48895 48895 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.00 3.15 100.00 ? ? 1.31 16.9 6574
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 8-BM 0.9795, 0.9422, 0.9793 APS 8-BM
Software
Software Name Purpose Version
SCALA data scaling CCP4_3.1.20
SHARP phasing .
DM phasing 4.2
REFMAC refinement refmac_5.1.24
PDB_EXTRACT data extraction 1.502
MOSFLM data reduction .
CCP4 data scaling (SCALA)