X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 293 0.45 mM EF-Tu in 50 mM Tris, pH 7.8, 10 mM GDP, 10 mM magnesium chloride, 0.5% PEG 3350, 5.5 mM ammonium acetate, 2.7 mM ammonium citrate, 1.34 mM ChemDiv compound 1013-0135, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 69.550 Å b: 69.550 Å c: 169.440 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 2.74 Solvent Content: 55.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.400 60.232 6083 586 87.100 ? 0.2619 75.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.400 60.232 90.200 0.174 0.174 3.200 6.600 ? 6312 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.40 3.58 84.9 84.90 0.48 1.5 6.90 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.033 ALS 5.0.2
Software
Software Name Purpose Version
SCALA data scaling .
PHASER phasing .
CNS refinement 1.1
PDB_EXTRACT data extraction 1.701
MOSFLM data reduction .
CCP4 data scaling (SCALA)