X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 295 0.1M HEPES pH 7.5, 0.4-0.5M NaCl, 0.1M CaCl2 and 8-10% PEG4000, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 135.080 Å b: 266.112 Å c: 201.731 Å α: 90.00° β: 104.71° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS THROUGHOUT 3.300 20.000 195669 3914 95.3 0.265 0.298 64.8
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.300 29.988 92.700 0.158 0.158 6.100 3.200 196320 195669 0 0 47.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.30 3.48 89.2 89.20 0.552 1.7 3.20 26742
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 0.97564 ESRF ID29
Software
Software Name Purpose Version
SCALA data scaling .
CNS refinement .
PDB_EXTRACT data extraction 1.701
MOSFLM data reduction .
CCP4 data scaling (SCALA)
SHARP phasing .
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