X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 15%(w/v) PEG 8000, 50mM mono-potassium dihydrogen phosphate, 10mM BaCl2 or 15% PEG 5000 MME, sodium acetate pH 4.6, 0.2M ammonium sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 67.706 Å b: 87.126 Å c: 95.048 Å α: 88.33° β: 76.79° γ: 90.19°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.59
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.900 29.030 45743 2314 97.760 0.234 0.282 65.522
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 30 97.9 ? 0.103 9.13 3.22 46876 45870 0 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.9 3.0 97.5 ? 0.551 2.14 3.2 4493
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I711 0.962 MAX II I711
Software
Software Name Purpose Version
REFMAC refinement 5.2.0003
PDB_EXTRACT data extraction 1.701
XDS data reduction .
XSCALE data scaling .
SHELXD phasing .
SOLVE phasing .
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