X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294 5 mM GTP, 10 mM MgCl2, 20% w/v polylethylene glycol 3350, 150 mM KF, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 132.610 Å b: 132.610 Å c: 72.530 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65
Crystal Properties:
Matthew's Coefficient: 2.47 Solvent Content: 50.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.080 116.038 43486 2235 99.300 0.214 0.242 30.571
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.08 116.038 99.3 0.055 0.055 11.900 5.500 43486 43486 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.21 ? 97.50 0.362 2.0 3.60 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.11588 ALS 8.3.1
Software
Software Name Purpose Version
SCALA data scaling .
AMoRE phasing .
CNS refinement .
PDB_EXTRACT data extraction 1.701
MOSFLM data reduction .
CCP4 data scaling (SCALA)