X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.7 285 Crystallization was performed by the vapor diffusion method using hanging drops (4 uL protein solution mixed with 4 uL (0.75 - 1.00)M NaCl - 0.1M MES - 0.1M Na/K PO4, pH 5.6 - 5.8) suspended over 1mL reservoir solutions of (1.25 - 1.50)M NaCl - 0.1M MES - 0.1M Na/K PO4 - 5mM-mercaptoethanol, pH 5.6-5.8. The trays were set at 4C for 5-7 days to control nucleation, followed by incubation for 3 weeks at 12C to maximize crystal growth. , pH 5.7, VAPOR DIFFUSION, HANGING DROP, temperature 285K
Unit Cell:
a: 224.909 Å b: 224.909 Å c: 75.402 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 3.88 Solvent Content: 68.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 2.70 8.0 17354 1713 98 0.189 0.26 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.70 50.0 98.1 ? 0.088 13.6 4.0 19889 19511 1.7 3 32.938
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.70 2.78 84.7 ? 0.323 3.0 2.6 1636
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 95 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 ? ?
Software
Software Name Purpose Version
HKL-2000 data collection .
SCALEPACK data scaling .
X-PLOR model building .
X-PLOR refinement 98.1
HKL-2000 data reduction .
X-PLOR phasing .