ISDA: 2FL3

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.4	289	20% PEG1000, 400mM NaCl, 100mM Bis-Tris propane, and 5% ethylene glycol, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 289K

Unit Cell:

a: 100.855 Å b: 100.855 Å c: 139.406 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 65 2 2

Crystal Properties:

Matthew's Coefficient: 2.91 Solvent Content: 57.72

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.39	34.17	14327	701	?	0.249	0.284	68.4

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.39	34.17	89.0	0.079	?	15.2	20.9	15524	15524	-3	-3	21.0

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.39	2.48	50.2	?	?	?	?	854

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 22-ID	1.0000	APS	22-ID

Software