X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 100 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU RU200 | 1.54 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| HKL-2000 | data collection | . |
| SCALEPACK | data scaling | . |
| CNS | refinement | . |
| HKL-2000 | data reduction | . |
| CNS | phasing | . |
