2FE6

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 277 7.5 MG/ML P450, 50 MM TRIS, 125 MM KCL, 13.5-15% PEG8000, 50 MM DTE, pH 7.4, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 64.390 Å b: 64.390 Å c: 252.730 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.87 Solvent Content: 57.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 1.500 18 84586 4230 97.900 0.236 0.249 16.327
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.40 18.0 96.600 ? 0.086 7.010 ? ? 84598 0 0 19.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.40 1.50 93.400 ? 0.24 2.380 ? 30433
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.93 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
CNS refinement .
PDB_EXTRACT data extraction 1.701
MAR345 data collection .
XDS data scaling .
CNS phasing .