X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 291 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| SEALED TUBE | ENRAF-NONIUS | 1.5418 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| CAD4 | data collection | . |
| CAD4 | data reduction | associated program |
| X-PLOR | model building | . |
| X-PLOR | refinement | . |
| CAD4 | data scaling | . |
| X-PLOR | phasing | . |
