X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.00 300 SODIUM NITRATE AS CRYSTALLIZING AGENT CROSS-LINKED BY VAPOR DIFFUSION WITH GLUTARALDEHYDE, PROTIEN CONCENTRATION 20 MG/ML, pH 6.00, VAPOR DIFFUSION, HANGING DROP, temperature 300K
Unit Cell:
a: 27.280 Å b: 32.020 Å c: 34.310 Å α: 88.53° β: 108.51° γ: 111.92°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.81 Solvent Content: 31.9
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 1.95 10.00 6985 ? 96.2 ? 0.1607 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.949 18.30 95.5 ? ? ? ? 7080 6985 2 4 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.949 2.1 94.1 ? ? 6.9 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 277.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LURE BEAMLINE DW32 0.964 LURE DW32
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SHELX model building .
SHELXL-97 refinement .
SHELX phasing .