ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	298.0	16 % PEG8000, 8 % isopropanol, 80 mM Hepes pH 7.5, 160 mM ammonium sulphate, 1 mM DTT, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K

Unit Cell:

a: 167.030 Å b: 174.170 Å c: 162.460 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: C 2 2 2

Crystal Properties:

Matthew's Coefficient: 3.38 Solvent Content: 63.66

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.900	19.690	52529	2648	100.000	0.202	0.245	57.512

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.90	20	98.600	0.087	?	20.610	?	52531	52531	0	-3.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.90	3.00	97.200	?	?	5.340	?	36376

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ESRF BEAMLINE ID29	1.00	ESRF	ID29

Software