X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 1.2M sodium potassium phosphate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 223.300 Å b: 223.300 Å c: 223.300 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 3.39 Solvent Content: 63.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.4 30 33998 1687 ? 0.235 0.265 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50 95.3 ? ? ? ? 35699 34021 ? 3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.49 100 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 0.97928 APS 22-BM
Software
Software Name Purpose Version
HKL-2000 data reduction .
SHARP phasing .
CNS refinement 1.1
HKL-2000 data scaling .