X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.50 277 8% PEG800, 33mM ZnAc, 17mM NaCacodylate, 0.85M NaCl, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K, pH 6.50
Unit Cell:
a: 59.291 Å b: 59.291 Å c: 218.876 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: P 43
Crystal Properties:
Matthew's Coefficient: 2.79 Solvent Content: 55.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIR THROUGHOUT 2.40 30.00 29039 1641 98.9 0.206 0.245 58.10
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 30.000 91.4 0.04 ? 35.6000 7.800 ? 29039 ? -1.000 50.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.40 2.48 58.8 ? ? 8.200 4.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF ? ? ?
Software
Software Name Purpose Version
HKL-2000 data reduction .
CCP4 model building .
CNS refinement 1.1
HKL-2000 data scaling .
CCP4 phasing .