X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 8%(w/v) PEG 6000, 6%(v/v) MPD, 100mM HEPES, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 61.323 Å b: 62.683 Å c: 73.562 Å α: 93.26° β: 107.39° γ: 108.71°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.56 Solvent Content: 51.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.60 19.81 123455 6195 95.7 0.199 0.219 20.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 20.0 95.9 0.032 ? 18.2 1.98 ? 123505 ? 0.000 21.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.60 1.66 94.9 ? ? 1.6 2.0 6807
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL44B2 1.0000 SPring-8 BL44B2
Software
Software Name Purpose Version
CNS refinement 1.0
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
AMoRE phasing .
Feedback Form
Name
Email
Institute
Feedback