X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 295 10% PEG 6000, 2M NaCl, pH 4.5, microbatch, temperature 295K
Unit Cell:
a: 130.934 Å b: 130.934 Å c: 130.934 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 43.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.15 32.73 9696 493 94.9 0.217 0.259 46.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.15 32.73 94.9 0.048 0.038 36.8 3.5 10214 9696 0.0 0.0 44.3
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.15 2.23 95.4 ? 0.294 4.8 3.0 954
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.5418 ? ?
Software
Software Name Purpose Version
HKL-2000 data collection .
AMoRE phasing .
CNS refinement 1.1
HKL-2000 data reduction .
SCALEPACK data scaling .