X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.2 298.0 30% v/v Propylene Glycol, 4% v/v PEG 400, 20% v/v Glycerol, 0.1M Na3Citrate, pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K
Unit Cell:
a: 105.675 Å b: 105.675 Å c: 105.675 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 3
Crystal Properties:
Matthew's Coefficient: 3.32 Solvent Content: 62.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD and MOLECULAR REPLACEMENT THROUGHOUT 2.10 47.26 22965 2269 98.8 0.219 0.239 38.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 50.0 100 0.080 ? 11.3 ? 23244 23244 0.0 0.0 20.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 100 ? ? ? ? 2285
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.9793 APS 22-ID
Software
Software Name Purpose Version
CNS refinement 1.1
MAR345dtb data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
AMoRE phasing .