X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.8 298 14% PEG 3350, 0.1M MES-NaOH pH 5.8, 6mM ZnSO4, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 48.077 Å b: 59.155 Å c: 170.684 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.10 Solvent Content: 41.50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 0.96 20.00 277615 14789 100.00 0.13332 0.14606 9.397
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.96 50 98.9 ? 0.127 22.1 5.3 295816 292562 -3 -3 6.373
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.96 0.99 91.7 ? 0.375 2.32 2.8 26836
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-5A 1.0000, 1.2824, 0.9800 Photon Factory BL-5A
Software
Software Name Purpose Version
REFMAC refinement 5.2.0019
PF data collection native
DENZO data reduction .
SCALEPACK data scaling .
SHELXE model building .
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