X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 77.128 Å b: 77.128 Å c: 76.661 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 4 2 2
Crystal Properties:
Matthew's Coefficient: 3.1 Solvent Content: 60.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 27.22 15432 801 99.95 0.19017 0.21851 23.202
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 30 99.7 0.096 ? 23.5 ? ? 43245 ? ? 18.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.86 98.2 ? ? 2.61 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL44XU 0.90 SPring-8 BL44XU
Software
Software Name Purpose Version
REFMAC refinement 5.0
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
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