X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.50 278 100mM CAPS-buffer, 1200mM NaH2PO4, 800mM K2HPO4, 50mM LiSO4, 5mM DTT, 20mM KPB, 10mg/ml GOX, pH 10.50, VAPOR DIFFUSION, SITTING DROP, temperature 278K
Unit Cell:
a: 123.875 Å b: 123.875 Å c: 168.762 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.80 45.27 19146 929 98.4 0.248 0.308 34.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.600 50.000 100.0 0.08 ? 34.043 10.000 ? 24388 ? ? 75.50
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.69 100.0 ? ? 4.779 9.80 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL24XU ? SPring-8 BL24XU
Software
Software Name Purpose Version
HKL-2000 data collection .
AMoRE phasing .
CNS refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .