X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.19mM [d(CGCGAATTCGCG)]2, 0.19mM TriplatinNC, 31mM sodium cacodylate (pH 6.5), 9.6mM magnesium chloride, 6.9% 2-methyl-2,4-pentanediol (MPD), equilibrated against a reservoir of 30% MPD, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 23.675 Å b: 41.692 Å c: 65.651 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.94
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R 1.13 5.50 18995 2112 81.9 ? 0.2321 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.07 50 90.1 ? ? ? 12.5 23727 21375 1.0 ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 175 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X26C 1.05 NSLS X26C
Software
Software Name Purpose Version
SHELX model building .
SHELXL-97 refinement .
CBASS data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .