X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 296 4.2M ammonium sulfate, 0.1M citrite, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 296K
Unit Cell:
a: 19.474 Å b: 41.324 Å c: 24.129 Å α: 90.00° β: 108.20° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.62 Solvent Content: 24.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 0.68 10 45181 5239 96 0.0991 0.1107 7.55
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.68 10 92.6 0.073 ? 24.2 16.6 52365 52365 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.68 0.75 57.1 ? ? 3.6 7.3 8999
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 110 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL12B2 0.689 SPring-8 BL12B2
Software
Software Name Purpose Version
SOLVE phasing .
SHELXL-97 refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .