X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8 ? 35% dioxane, pH 8, VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 29.334 Å b: 29.334 Å c: 46.892 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 42 2 2
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.25 8.0 6727 ? ? 0.119 0.161 27.161
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.200 50.000 98.000 0.081 ? 7.100 ? ? 12427 0.0 -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.20 1.24 94.40 ? ? ? ? 611
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 277 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 32-ID 1.0 APS 32-ID
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SHELX refinement .
PDB_EXTRACT data extraction 2.000
PHASER phasing .
SHELXL refinement .