X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 298 0.4M ammonium sulfate, 0.1M bicine, 0.15M sodium iodide, 1.6% protein, pH 9.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 48.970 Å b: 58.510 Å c: 69.800 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.40 Solvent Content: 48.72
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.11 19.8 77502 3875 ? 0.108 0.121 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.11 19.8 96.9 0.066 ? ? 6.6 80022 77541 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.11 1.17 86.5 ? ? ? 6.3 11532
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-18B 1.15 Photon Factory BL-18B
Software
Software Name Purpose Version
HKL-2000 data collection .
TRUNCATE data reduction .
CNS refinement .
SHELXL-97 refinement .
HKL-2000 data reduction .
CCP4 data scaling (TRUNCATE)
CNS phasing .