X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.75 ? HANGING DROP VAPOR DIFFUSION, 9.0-10.5 MG/ML F93 IN 10 MM TRIS-HCL, PH 8.0, 50 MM NACL, 0.5 MM TCEP MIXED WITH BUFFER CONTAINING 0.1 M SODIUM ACETATE, PH 4.75-5.0, 0.1 M MAGNESIUM NITRATE HEXAHYDRATE, 16-20% PEG 20,000.
Unit Cell:
a: 42.050 Å b: 102.594 Å c: 92.398 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.1 Solvent Content: 41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.20 46.37 9938 508 99.7 0.192 0.232 42.80
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.20 50.00 99.8 0.06 ? 33.00 7.1 ? 10466 ? 3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.28 100.0 ? 4.20 7.3
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-1 ? SSRL BL9-1
Software
Software Name Purpose Version
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .
RESOLVE phasing .
REFMAC refinement 5.2.0019
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