X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.50 ? CONDITIONS: 21-23 % (W/V) POLY(ETHYLENE) GLYCOL 5000 MONMETHYL ETHER; 0.1 M SODIUM CACODYLATE PH 6.5; 50 MM MAGNESIUM ACETATE CRYOSOLUTION: 16 % GLYCEROL (V/V) WITH HIGHER CONCENTRATION OF POLY(ETHYLENE) GLYCOL
Unit Cell:
a: 51.552 Å b: 60.125 Å c: 60.348 Å α: 113.99° β: 101.37° γ: 100.50°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.4 Solvent Content: 48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.80 20.00 13637 724 94.2 0.197 0.296 75.31
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.800 20.000 93.4 0.11000 ? 5.7000 1.900 ? 14370 ? 0.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.80 2.95 83.0 ? 2.400 1.80
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 120.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SRS BEAMLINE PX9.6 0.87, 1.28258 SRS PX9.6
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling .
SHELXD phasing .
SHARP phasing .
REFMAC refinement 5.2.0013
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