X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 ? 1.0 M SODIUM CITRATE AND 0.1 M CACODYLATE (PH 6.5).
Unit Cell:
a: 35.340 Å b: 41.434 Å c: 44.600 Å α: 84.45° β: 91.51° γ: 73.89°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.2 Solvent Content: 42.6
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 44.32 11511 942 88.4 0.161 0.199 24.61
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 30.00 88.6 0.04 ? 22.30 2.3 ? 12453 ? ? 29.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 46.6 ? 3.00 2.0
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 ? ? ?
Software
Software Name Purpose Version
REFMAC refinement 5.2.0005
HKL-2000 data reduction .
HKL-2000 data scaling .
AMoRE phasing .