X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 277 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | RIGAKU RU200 | ? | ? | ? |
Software Name | Purpose | Version |
---|---|---|
PROCESS | data collection | (RIGAKU) |
SCALE | data reduction | (RIGAKU) |
X-PLOR | model building | . |
CNX | refinement | 2002 |
PROCESS | data reduction | (RIGAKU) |
SCALE | data scaling | (RIGAKU) |
X-PLOR | phasing | . |