X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 297 PEG 4K, Hepes, NaCl, CaCl2, pH 7.5, vapor diffusion, hanging drop, temperature 297K
Unit Cell:
a: 48.100 Å b: 48.500 Å c: 63.900 Å α: 97.00° β: 109.00° γ: 106.70°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.2
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION FOURIER SYNTHESIS ? 1.9 6.0 69729 ? ? ? 0.314 19.625
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 19.3 90.0 ? ? 10.3 ? ? 69729 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.9 2.0 88.1 ? ? 2.9 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.54 ? ?
Software
Software Name Purpose Version
X-PLOR refinement .
PDB_EXTRACT data extraction 1.700
MOSFLM data reduction .
CCP4 data scaling (SCALA)
X-PLOR phasing .
CNS refinement .